Extraction of Permittivity and Permeability for Ferrites and Flexible Magnetodielectric Materials using a Genetic Algorithm
A hybrid approach, based on the two-dimensional finite-element method (2-D-FEM) and a genetic algorithm (GA) optimization, is used to extract relative permittivity and permeability of ferrites and flexible magnetodielectric composite materials over wide frequency bands. S-parameters of a material under test (MUT) placed into a coaxial fixture are measured by a vector network analyzer and simulated using the 2-D-FEM code. The GA optimization procedure is then used to minimize the discrepancies between the measured and simulated S-parameters by iteratively searching the possible best permittivity and permeability. Multiterm Debye models of wideband complex permittivity and permeability are employed here for a frequency-dispersive MUT. This greatly reduces the number of unknowns in the GA optimization. The proposed method is tested with PTFE and a virtual magnetic material.
S. Jing et al., "Extraction of Permittivity and Permeability for Ferrites and Flexible Magnetodielectric Materials using a Genetic Algorithm," IEEE Transactions on Electromagnetic Compatibility, vol. 57, no. 3, pp. 349-356, Institute of Electrical and Electronics Engineers (IEEE), Jun 2015.
The definitive version is available at https://doi.org/10.1109/TEMC.2015.2389332
Electrical and Computer Engineering
Center for High Performance Computing Research
Second Research Center/Lab
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Algorithms; Complex networks; Electric network analyzers; Ferrite; Ferrites; Frequency bands; Genetic algorithms; Gyrators; Hybrid materials; Iterative methods; Magnetic materials; Permittivity; Scattering parameters; Complex permittivity and permeabilities; Dispersive media; Genetic-algorithm optimizations; Magneto-dielectric composites; Magnetodielectric materials; Relative permittivity and permeability; Two dimensional finite element method; Vector network analyzers; Finite element method
International Standard Serial Number (ISSN)
Article - Journal
© 2015 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Jun 2015