Abstract
The IEC 61967-2 TEM cell standard allows for variations in test parameters which may cause variations in the measured emissions from integrated circuits (ICs). To test the impact of these parameters, two printed circuit boards were designed within the IEC standard using "poor" PCB design strategies and using "good" design strategies. Emissions from three pin-for-pin compatible 8051 microcontrollers were tested. Emissions were measured using both PCBs, changing the PCB configuration, and changing test parameters like the program running on the IC, the rise time of the input clock, and I/O switching. Emissions from the "poor" PCB were about 3-8 dB higher than emissions from the "good" PCB. A change in the program run by the IC, the clock rise-time, and I/O caused a 4-15 dB change in emissions. Emissions differed considerably among the ICs. Possible causes for variations in emissions with the test parameters are discussed.
Recommended Citation
V. Kasturi and D. G. Beetner, "The Influence of Test Parameters on TEM Cell Measurements of ICs," Proceedings of the 2008 IEEE International Symposium on Electromagnetic Compatibility (2008, Detroit, MI), Institute of Electrical and Electronics Engineers (IEEE), Aug 2008.
The definitive version is available at https://doi.org/10.1109/ISEMC.2008.4652123
Meeting Name
IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 (2008: Aug. 18-22, Detroit, MI)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
TEM-Cell Method; Emissions; Electromagnetic compatibility; Integrated circuits; Testing
International Standard Book Number (ISBN)
978-1-4244-1699-8
International Standard Serial Number (ISSN)
2158-110X
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2008
