Associative or content addressable memories can be used for many computing applications. This paper discusses fault modeling for the content addressable memory (CAM) chips. Detailed examination of a single CAM cell is presented. A functional fault model for a CAM architecture executing exact match derived from the single cell model is presented. An efficient testing strategy can be derived using the proposed fault model
W. K. Al-Assadi et al., "On Fault Modeling and Testing of Content-addressable Memories," Records of the IEEE International Workshop on Memory Technology, Design and Testing, 1994, Institute of Electrical and Electronics Engineers (IEEE), Jan 1994.
The definitive version is available at https://doi.org/10.1109/MTDT.1994.397193
Electrical and Computer Engineering
Keywords and Phrases
CAM Architecture; CAM Chips; IC Testing; Associative Memories; Content-Addressable Memories; Content-Addressable Storage; Fault Diagnosis; Fault Modeling; Integrated Circuit Testing; Integrated Memory Circuits; Memory Architecture; Testing Strategy
Article - Conference proceedings
© 1994 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Jan 1994