Abstract
A procedure for the calibration and compensation of near-field scanning is described and demonstrated. Ultimately, the objective is to quantify the individual field components associated with electromagnetic interference (EMI) from high speed circuitry and devices. Specific examples of these methods are shown. The effects of compensation are small but noticeable when the uncompensated output signal from near field scanning is already a very good representation of the field being measured. In other cases, the improvement provided by compensation can be significant when the uncompensated output signal bears little resemblance to the underlying field.
Recommended Citation
M. Yamaguchi et al., "Calibration and Compensation of Near-Field Scan Measurements," IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers (IEEE), Jan 2005.
The definitive version is available at https://doi.org/10.1109/TEMC.2005.853165
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Calibration; EMI; Compensation; Electric Field Measurement; Electromagnetic Interference; Field Components; Near-Field Probes; Near-Field Scan Measurements; Near-Field Scanning
International Standard Serial Number (ISSN)
0018-9375
Document Type
Article - Journal
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2005 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jan 2005
