With the recent development of nanoscale materials and assembly techniques, it is envisioned to build high-density reconfigurable systems which have never been achieved by the photolithography. Various reconfigurable architectures have been proposed based on nanowire crossbar structure as the primitive building block. Unfortunately, high-density systems consisting of nanometer-scale elements are likely to have many imperfections and variations; thus, defect-tolerance is considered as one of the most exigent challenges. In this paper, we evaluate three different logic mapping algorithms with defect avoidance to circumvent clustered defective crosspoints in nanowire reconfigurable crossbar architectures. The effectiveness of inherited redundancy and configurability utilization is demonstrated through extensive parametric simulations.
Y. Yellambalase et al., "Inherited Redundancy and Configurability Utilization for Repairing Nanowire Crossbars with Clustered Defects," Proceedings of the 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (2006, Arlington, VA), pp. 98-106, IEEE Computer Society, Oct 2006.
The definitive version is available at https://doi.org/10.1109/DFT.2006.37
21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (2006: Oct. 4-6, Arlington, VA)
Electrical and Computer Engineering
Keywords and Phrases
Algorithms; Computer Simulation; Crossbar Equipment; Defects; Photolithography; Redundancy, Defect-Tolerance; Nanometer-Scale Elements; Nanowire Crossbar Structure; Reconfigurable Systems; Nanowires
International Standard Book Number (ISBN)
International Standard Serial Number (ISSN)
Article - Conference proceedings
© 2006 IEEE Computer Society, All rights reserved.
01 Oct 2006