Advances in EMI and GPR Algorithms in Discrimination Mode Processing for Handheld Landmine Detectors
This paper presents some advancement in the detection algorithms using EMI sensor, GPR sensor and their fusion. In the EMI algorithm, we propose the application of the weighted distributed density (WDD) functions on the wavelet domain and the time domain of the EMI data for feature based detection. A multilayer perceptron technique is then applied to discriminate between mine and clutter objects based on the wavelet domain and time domain features separately. When the results from the two domains are fused together, the probability of false alarms is reduced by a factor of two. The enhancement in the GPR algorithm includes the depth processing which selects a certain data segment below the ground surface for detection, as well as utilizing the phase variation of the signal return across a mine to achieve better detection. Finally, we present fusion results from EMI and GPR sensors to demonstrate that the two sensors provide complementary information and when they are properly fused together the probability of false alarm can be reduced significantly.
R. J. Stanley et al., "Advances in EMI and GPR Algorithms in Discrimination Mode Processing for Handheld Landmine Detectors," Proceedings of the SPIE 5415, Detection and Remediation Technologies for Mines and Minelike Targets IX (2004, Orlando, FL), vol. 5415, no. PART 2, pp. 874-882, SPIE -- The International Society for Optical Engineering, Apr 2004.
The definitive version is available at https://doi.org/10.1117/12.544328
SPIE 5415, Detection and Remediation Technologies for Mines and Minelike Targets IX (2004: Apr. 12, Orlando, FL)
Electrical and Computer Engineering
SPIE - The International Society for Optical Engineering
Keywords and Phrases
EMI Sensor; GPR Sensor; Detection Algorithms; Weighted Distributed Density (WDD); Electromagnetic induction; Ground penetrating radar; Land mine detection; Metal detector
International Standard Serial Number (ISSN)
Article - Conference proceedings
© 2004 SPIE -- The International Society for Optical Engineering, All rights reserved.
01 Apr 2004