Experimental measurements and numerical modeling were used to study the EMI performance of a module-on-backplane connector for various configurations of signal-return pin-outs. A commercially available open-pin-field connector was used in these results to connect between the mother-board and the daughter-card. The experimental techniques, based on measuring |S21|, included both common-mode current measurements and monopole near-field probe measurements. The FDTD method was used to provide numerical support of the near-field measurements and generally agreed with the measured results for frequencies up to 3 GHz. The FDTD method was also used to investigate the relationship between the radiated EMI at 3 m and the connector pin-out configurations.
X. Ye et al., "Experimental and FDTD Study of the EMI Performance of an Open-Pin-Field Connector for Modules-on-Backplanes," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2000, Washington, D.C.), vol. 2, pp. 789 - 794, Institute of Electrical and Electronics Engineers (IEEE), Aug 2000.
The definitive version is available at https://doi.org/10.1109/ISEMC.2000.874722
IEEE International Symposium on Electromagnetic Compatibility (2000: Aug. 21-25, Washington, DC)
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
3 GHz; EMI Performance; FDTD Study; Common-Mode Current Measurements; Daughter-Card; Electric Connectors; Finite Difference Time-Domain Analysis; Module-On-Backplane Connector; Monopole Near-Field Probe Measurements; Mother-Board; Open-Pin-Field Connector; Radiofrequency Interference; Signal-Return Pin-Outs; Electric Current Measurement; Electromagnetic Wave Interference; Finite Difference Method; Mathematical Models; Time Domain Analysis; Common-Mode Current Measurement; Electric Connectors
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Article - Conference proceedings
© 2000 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Aug 2000