Keywords and Phrases
“The ESD (Electrostatic discharge) failures have been raising critical reliability problems in electronic devices design. However, not all the ESD scenarios have been specified by the IEC standard and the characterizations of the ESD risk for different scenarios are essential to evaluate the ESD robustness of the devices in the real word.
The insulation of plastic enclosures provides protection against ESD to the electronic system inside. However, seams between plastic parts are often unavoidable. Different plastic arrangements are constructed to investigate the spark length and current derivatives and to understand the ESD spark behavior for geometries having spark lengths longer than the values predicted by Paschen’s law.
For the wearable devices, the core difference between the posture assumed for IEC 61000-4-2 human metal discharge and a discharge to a wearable device is the impedance between the charged body and the grounded structure discharged to. The results show that the current measured in the brush-by scenario can reach values twice as high as the current specified in the IEC standard. A simulation model using the measured impedance and Rompe and Weizel’s law provides predictions on the peak current derivative when the spark length is varied. The increasing peak current derivative with shorter spark length indicates stronger field coupling to the devices.
SEED(System-efficient ESD design) modeling helps the designer to predict the ESD risk at the early stage, an accurate TVS model can be used to study the transient response of the external TVS and the on-chip protection when applied in a typical high-speed input/output (I/O) interface”--Abstract, page iv.
Beetner, Daryl G.
Fan, Jun, 1971-
Hor, Yew San
Electrical and Computer Engineering
Ph. D. in Electrical Engineering
Electromagnetic Compatibility (EMC) Laboratory
Missouri University of Science and Technology
Journal article titles appearing in thesis/dissertation
- ESD spark behavior and modeling for geometries having spark lengths greater than the value predicted by Paschen's law
- Characterization of the ESD risk for wearable devices
- Race conditions among protection devices for a high speed USB 3.x interface
xii, 75 pages
© 2022 Jianchi Zhou, All rights reserved.
Dissertation - Open Access
Zhou, Jianchi, "Characterization and modeling of ESD events, risk and protection" (2022). Doctoral Dissertations. 3163.