Keywords and Phrases
Ferrite sheet; Metal-oxide-semiconductor (MOS); Monte Carlo particle simulation; Permeability; Planar inductor; Through-silicon-via (TSV)
"This dissertation is divided into three papers, covering two major topics. The first topic, techniques for ferrite characterization, is discussed over the course of two papers. The second topic, particle simulations for semiconductor devices, is discussed in the last paper. In the first paper, the method for extracting permeability from ferrite materials is discussed for the Keysight 16454A permeability extraction fixture, where the ferrite material to be characterized is assumed to be homogeneous. Then the method is updated to account for layered materials. The updated method is verified through full-wave simulations. In the second paper, a planar printed circuit board (PCB) coil is proposed as an alternative to the Keysight 16454A fixture for extracting permeability from ferrite materials. The method of extraction is verified through full-wave simulations. The final paper (and second topic) develops a particle simulator, based on the Boltzmann transport equation (BTE) and Monte Carlo (MC) methods, for studying semiconductor devices with submicron feature sizes. Particle simulations are advantageous because full-wave simulators based purely on Maxwell's equations are not able to capture certain semiconductor effects. This work specifically investigates metal-oxide-semiconductor (MOS) effects for a pair of through-silicon-vias (TSVs), and the corresponding accumulation and depletion regions formed for different bias voltages"--Abstract, page iv.
Fan, Jun, 1971-
Drewniak, James L.
Beetner, Daryl G.
Electrical and Computer Engineering
Ph. D. in Computer Engineering
National Science Foundation (U.S.)
Missouri University of Science and Technology
Journal article titles appearing in thesis/dissertation
- Permeability extraction of layered magnetic material using Keysight 16454A fixture
- Ferrite sheet characterization using a planar PCB coil
- Monte Carlo particle simulations for studying through-silicon-via (TSV) capacitance
x, 156 pages
© 2019 Nicholas Garrett Erickson, All rights reserved.
Dissertation - Open Access
Electronic OCLC #
Erickson, Nicholas, "Ferrite characterization techniques & particle simulations for semiconductor devices" (2019). Doctoral Dissertations. 2774.