Doctoral Dissertations

Keywords and Phrases

Detectors; Electromagnetic Compatibility; Electromagnetic Interference; Electrostatic Discharge; Soft Failure; Transient Sensors

Abstract

"System level electrostatic discharge (ESD) testing of electronic products is a critical part of product certification. Test methods were investigated to develop system level ESD simulation models to predict soft-failures in a system with multiple sensors. These methods rely completely on measurements. The model developed was valid only for the linear operation range of devices within the system. These methods were applied to a commercial product and used to rapidly determine when a soft failure would occur. Attaching cables and probes to determine stress voltages and currents within a system, as in the previous study, is time-consuming and can alter the test results. On-chip sensors have been developed which allow the user to avoid using cables and probes and can detect an event along with the level, polarity, and location of a transient event seen at the I/O pad. The sensors were implemented with minimum area consumption and can be implemented within the spacer cell of an I/O pad. Some of the proposed sensors were implemented in a commercial test microcontroller and have been tested to successfully record the event occurrence, location, level, and polarity on that test microcontroller. System level tests were then performed on a pseudo-wearable device using the on-chip sensors. The measurements were successful in capturing the peak disturbance and counting the number of ESD events without the addition of any external measurement equipment. A modification of the sensors was also designed to measure the peak voltage on a trace or pin inside a complex electronic product. The peak current can also be found when the sensor is placed across a transient voltage suppressor with a known I-V curve. The peak level is transmitted wirelessly to a receiver outside the system using frequency-modulated magnetic or electric fields, thus allowing multiple measurements to be made without opening the enclosure or otherwise modifying the system. Simulations demonstrate the sensors can accurately detect the peak transient voltage and transmit the level to an external receiver"--Abstract, page iv.

Advisor(s)

Pommerenke, David
Beetner, Daryl G.

Committee Member(s)

Drewniak, James L.
Fan, Jun, 1971-
Khilkevich, Victor
Stockinger, Michael

Department(s)

Electrical and Computer Engineering

Degree Name

Ph. D. in Electrical Engineering

Publisher

Missouri University of Science and Technology

Publication Date

Spring 2018

Journal article titles appearing in thesis/dissertation

  • Systematic Evaluation of Soft-Failures in System Level ESD Transient Events
  • An On-Chip Detector of Transient Stress Events
  • Transient Peak Voltage Level Sensor
  • Characterizing ESD Stress Currents in Human Wearable Devices
  • A Transient Event Sensor for Efficient System Level ESD Testing

Pagination

xv, 112 pages

Note about bibliography

Includes bibliographic references.

Rights

© 2018 Abhishek Patnaik, All rights reserved.

Document Type

Dissertation - Open Access

File Type

text

Language

English

Thesis Number

T 11311

Electronic OCLC #

1041858835

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