Keywords and Phrases
EMI; Near field scanning; Near to far field; Source localization
"For complex and large systems with multiple sources, it is often difficult to localize the sources of radiation. Near-field electromagnetic scanning is used often for root-cause diagnosis by determining field distribution close to the PCB. In the near-field, the evanescent waves are dominant, which may lead to the misinterpretation of them being the dominant sources contributing to the far-field. Another limitation of near-field scanning is that the probe may not be able to access all locations near the PCB due to the complex geometry and high component density. Two-dimensional synthetic aperture radar is a well-known technique used for antenna diagnostic and alignment of phase array antennas. Using a technique which is derived from the synthetic aperture radar we present emission source microscopy to localize the sources of active radiation on a PCB. After obtaining the location of sources, using near field to far-field transformation, it is shown that the far-field radiation patterns and the total radiated power can be estimated. Using masking algorithms the contribution of individual sources to far-field can be determined. The source localization methodology is presented along with simulation and measurement results on real-DUTs. The results show that the proposed method is capable of detecting multiple active sources on a complex PCB. Different phase measurement methods are presented along with the measurement results. Also, methods to reduce the scanning time for source localization are presented"--Abstract, page iii.
Liu, Xiaoqing Frank
Electrical and Computer Engineering
Ph. D. in Computer Engineering
Missouri University of Science and Technology
xiii, 131 pages
© 2014 Pratik Rajesh Maheshwari, All rights reserved.
Dissertation - Open Access
Near-fields -- Measurement
Synthetic aperture radar
Electronic OCLC #
Maheshwari, Pratik Rajesh, "Emission source microscopy for electromagnetic interference source localization" (2014). Doctoral Dissertations. 2334.