Instrument response function for scanning force microscopy and defects on mica induced by 50 kilo-electron-volts argon ions
Ph. D. in Physics
University of Missouri--Rolla
xvi, 121 pages
© 1996 Lu Fei, All rights reserved.
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Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.http://merlin.lib.umsystem.edu/record=b3589397~S5
Fei, Lu, "Instrument response function for scanning force microscopy and defects on mica induced by 50 kilo-electron-volts argon ions" (1996). Doctoral Dissertations. 1172.
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