A Conversion Electron Mössbauer Spectral Study of Dy₃Fe₅O₁₂ Thin Films
Thin films of the garnet, Dy3Fe5O12, have been sputtered on quartz plates using both a ceramic target of powdered Dy3Fe5 O12 and a metallic target of Dy and Fe. In the latter case, the metallic DyFe thin film has subsequently been oxidized at temperatures between 1173 and 1373 K. The x-ray diffraction patterns and conversion electron Mössbauer spectra, CEMS, of the thin films prepared from the ceramic target show only the garnet phase, whereas those of the thin films prepared from the metallic target show the garnet phase and two impurity phases, Fe2O3 and DyFeO3. The CEMS of the ceramic target thin films indicate that the iron magnetic moments are not oriented along the  axis, as is usually observed in bulk materials, but are compatible with moments oriented along the  axis. Further, the relative areas of the six lines of the five component Sextets used to model the spectra reveal that the hyperfine fields are rotated by 34° from the normal to the thin films. In contrast, the relative areas of the Dy3Fe5O12 spectrum in the metallic target films reveal that the hyperfine fields are rotated by 60° from the normal to the thin films. Hence, the orientation of the iron moments is influenced by the film preparation route.
D. Vandormael et al., "A Conversion Electron Mössbauer Spectral Study of Dy₃Fe₅O₁₂ Thin Films," IEEE Transactions on Magnetics, vol. 37, no. 4, pp. 2435-2437, Institute of Electrical and Electronics Engineers (IEEE), Aug 2002.
The definitive version is available at https://doi.org/10.1109/20.951195
Keywords and Phrases
Dysprosium Alloys; Film Preparation; Garnets; Magnetic Moments; Magnetooptical Effects; Mathematical Models; Mössbauer Spectroscopy; Oxidation; Sputter Deposition; X Ray Diffraction Analysis; Conversion Electron Mössbauer Spectra (CEMS); Magnetic Thin Films; Magneto-optical Materials; Sputtered Thin Films
International Standard Serial Number (ISSN)
Article - Journal
© 2002 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
07 Aug 2002