A Mössbauer Effect Study of the Magnetic Properties of a Series of Tb₂Fe₁₇₋ₓSiₓ Solid Solutions
The Mössbauer spectra of a series of rhombohedral Tb2Fe17-xSix solid solutions, with x equal to 0, 1, 2, and 3, have been measured as a function of temperature. Although the spectra of Tb2Fe17 change substantially upon cooling from 295 to 85 K, it has been possible to fit them with a consistent seven sextet model corresponding to basal magnetization. The spectral analysis yields reasonable hyperfine parameters and the expected changes with temperature. The resulting weighted average effective recoil iron mass of 67 g/mol and the Mössbauer temperature of 396 K are typical of this type of intermetallic compound. In addition, the isomer shifts and hyperfine fields observed for the four crystallographically distinct iron sites in Tb2Fe17 agree well with those expected from the differences in the Wigner-Seitz cell volumes and the near-neighbor environments of the four sites. The spectra of the silicon substituted solid solutions have been fit with the same model and similar hyperfine parameters, but with a binomial distribution of near-neighbor environments. At 295 K the weighted average hyperfine field remains virtually constant for x=0, 1, and 2, and decreased slightly for x= 3. In contrast, the weighted average isomer shift increases with increasing x.
D. Hautot et al., "A Mössbauer Effect Study of the Magnetic Properties of a Series of Tb₂Fe₁₇₋ₓSiₓ Solid Solutions," Proceedings of the 1998 IEEE International Magnetics Conference (INTERMAG) (1998, San Francisco, CA), pp. 164, Institute of Electrical and Electronics Engineers (IEEE), Jan 1998.
The definitive version is available at https://doi.org/10.1109/INTMAG.1998.737364
7th Joint MMM-Intermag Conference (1998: Jan. 6-9; San Francisco, CA)
Keywords and Phrases
Magnetic Properties; Iron; Temperature; Solids; Cooling; Magnetization; Spectral Analysis; Intermetallic; Crystallography; Silicon
International Standard Book Number (ISBN)
Article - Conference proceedings
© 1998 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Jan 1998