Finding Noise-Related Artifacts in Scanned-Probe Microscope Images
Structures not of the actual specimen may appear in scanned probe microscopic images. These may arise from time domain instabilities of the microscope. Presented in this article are the artifacts independent of tip shape and existing in the slow scan limit, and the way in which low pass filtering can give the artifacts 3D character. Tests using Fourier phases and amplitudes in scanned probe images are conducted to detect the presence of the artifacts.
H. P. Siriwardane et al., "Finding Noise-Related Artifacts in Scanned-Probe Microscope Images," Proceedings of the 51st Annual Meeting Microscopy Society of America (1993, Cincinnati, OH), pp. 524-525, Microscopy Society of America, Aug 1993.
51st Annual Meeting Microscopy Society of America (1993: Aug. 1-6, Cincinnati, OH)
Materials Science and Engineering
Keywords and Phrases
Deposition; Fourier Transforms; Imaging Techniques; Plasmas; Signal Filtering and Prediction; Stability; Structure (composition); Feedback Loop; Fourier Phases; Low Pass Filtering; Noise Related Artifacts; Phase Randomization Image; Scanned Probe Microscope Images; Time Domain Instability; Microscopes
International Standard Serial Number (ISSN)
Article - Conference proceedings
© 1993 Microscopy Society of America, All rights reserved.
06 Aug 1993