Title

Finding Noise-Related Artifacts in Scanned-Probe Microscope Images

Abstract

Structures not of the actual specimen may appear in scanned probe microscopic images. These may arise from time domain instabilities of the microscope. Presented in this article are the artifacts independent of tip shape and existing in the slow scan limit, and the way in which low pass filtering can give the artifacts 3D character. Tests using Fourier phases and amplitudes in scanned probe images are conducted to detect the presence of the artifacts.

Meeting Name

51st Annual Meeting Microscopy Society of America (1993: Aug. 1-6, Cincinnati, OH)

Department(s)

Chemistry

Second Department

Materials Science and Engineering

Third Department

Physics

Keywords and Phrases

Deposition; Fourier Transforms; Imaging Techniques; Plasmas; Signal Filtering and Prediction; Stability; Structure (composition); Feedback Loop; Fourier Phases; Low Pass Filtering; Noise Related Artifacts; Phase Randomization Image; Scanned Probe Microscope Images; Time Domain Instability; Microscopes

International Standard Serial Number (ISSN)

0424-8201

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 1993 Microscopy Society of America, All rights reserved.

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