Practical Application of Physics-Based TVS Models
Location
Havener Center, Meramec Gasconade Room, 9:30am-11:30am
Start Date
4-2-2026 10:30 AM
End Date
4-2-2026 11:00 AM
Presentation Date
April 2, 2026; 10:30am-11:00am
Description
System-level ESD (SEED) simulations require accurate representation of the behavior of protection devices. In this work, a previously developed physics-based snapback model for transient voltage suppressors (TVS) is applied to both on-chip and off-chip ESD protection elements. Several model variations are investigated to approximate the observed double-snapback behavior, and the model is further modified to capture this behavior. The results demonstrate that capturing the double-snapback behavior, even in a simplified manner, significantly improves the prediction of both quasi-static and peak voltages and currents in system-level simulations. Finally, a practical analysis approach is presented to help engineers identify which device characteristics are most critical to include in simplified models.
Biography
Yejun Kim is a graduate researcher in Electrical Engineering at the Missouri University of Science and Technology (Missouri S&T), system-level ESD/EMC co-design, and dielectric characterization.
He is engaged in system-level ESD and EMC research, where he explores the interaction between device-level behavior and board/system-level protection strategies. He is currently leading a hardware-oriented project for the IEEE EMC+SIPI 2026 Student Hardware Competition, involving the design and comparative analysis of EMC-aware and EMC-unaware embedded systems.
His broader research goal is to explore the application of AI/ML techniques in system-level ESD analysis and design. While his current work focuses on physics-based modeling and measurement, he is interested in incorporating data-driven approaches, including machine learning and deep learning, to enhance ESD modeling, reliability analysis, and system-level protection strategies.
Meeting Name
2026 - Miners Solving for Tomorrow Research Conference
Department(s)
Electrical and Computer Engineering
Document Type
Presentation
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2026 The Authors, All rights reserved
Practical Application of Physics-Based TVS Models
Havener Center, Meramec Gasconade Room, 9:30am-11:30am
System-level ESD (SEED) simulations require accurate representation of the behavior of protection devices. In this work, a previously developed physics-based snapback model for transient voltage suppressors (TVS) is applied to both on-chip and off-chip ESD protection elements. Several model variations are investigated to approximate the observed double-snapback behavior, and the model is further modified to capture this behavior. The results demonstrate that capturing the double-snapback behavior, even in a simplified manner, significantly improves the prediction of both quasi-static and peak voltages and currents in system-level simulations. Finally, a practical analysis approach is presented to help engineers identify which device characteristics are most critical to include in simplified models.
Comments
Advisor: Daryl G. Beetner, daryl@mst.edu