Raman Spectroscopy of Nanocrystalline Ceria and Zirconia Thin Films

Author

Igor Kosacki
Vladimir Petrovsky
Harlan U. Anderson, Missouri University of Science and TechnologyFollow
Philippe Colomban

Abstract

The results of Raman-scattering studies of nanocrystalline CeO₂ and ZrO₂:16% Y (YSZ) thin films are presented. The relationship between the lattice disorder and the form of the Raman spectra is discussed and correlated with the microstructure. It is shown that the Raman line shape results from phonon confinement and spatial correlation effects and yields information about the material nonstoichiometric level.

Recommended Citation

I. Kosacki et al., "Raman Spectroscopy of Nanocrystalline Ceria and Zirconia Thin Films," Journal of the American Ceramic Society, vol. 85, no. 11, pp. 2646 - 2650, Wiley, Jan 2002.

The definitive version is available at https://doi.org/10.1111/j.1151-2916.2002.tb00509.x

Department(s)

Materials Science and Engineering

Publication Status

Full Access

International Standard Serial Number (ISSN)

0002-7820

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2024 Wiley, All rights reserved.

Publication Date

01 Jan 2002