Abstract
Microstructural characterization is a vital part in materials science, as it plays a key role in understanding the structure-property relationship in materials. Various advanced microstructural characterization techniques have emerged, for example, scanning electron microscopy, transmission electron microscopy, scanning transmission electron microscopy, high resolution (scanning) transmission electron microscopy, electron backscatter diffraction, energy dispersive x-ray spectroscopy, electron energy loss spectroscopy, precession electron diffraction, energy-filtered transmission electron microscopy, and atom probe tomography. The applications of these techniques have greatly advanced the understanding of material microstructures on different scales from micrometer to atomic scale. Advanced microstructural characterization can be applied to a variety of materials such as metals, alloys, ceramics, polymers and composites.
Recommended Citation
H. Wen, "Preface to the Special Issue on Advanced Microstructural Characterization of Materials," AIMS Materials Science, vol. 3, no. 3, AIMS Press, Aug 2016.
The definitive version is available at https://doi.org/10.3934/matersci.2016.3.1255
Department(s)
Materials Science and Engineering
International Standard Serial Number (ISSN)
2372-0484
Document Type
Article - Journal
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2016 AIMS Press, All rights reserved.
Creative Commons Licensing
This work is licensed under a Creative Commons Attribution 4.0 License.
Publication Date
01 Aug 2016
