The development of near field probing systems for EMC near field visualization and EMI source localization

Author

Hui He

Keywords and Phrases

EMC; EMI; Optical tracking

Abstract

"The objectives of this research are to visualize the frequency dependent electromagnetic field distribution for electromagnetic compatibility (EMC) applications and the radiating source reconstruction on complex shaped electronic systems. This is achieved by combining near field probing with a system for automatically recording the probe position and orientation. Due to the complexity of the shape of the electronic systems of interest, and for utilizing the expertise of the user, the probe will be moved manually not robotically. Concurrently, the local near field will be recorded, associated with the location and displayed at near real time on the captured 3D geometry as a field strength map for EMC applications and, for source reconstruction, a reconstructed image showing the far field radiating sources."--Abstract, page iii.

Advisor(s)

Pommerenke, David

Committee Member(s)

Fan, Jun, 1971-
Khilkevich, Victor

Department(s)

Electrical and Computer Engineering

Degree Name

M.S. in Electrical Engineering

Publisher

Missouri University of Science and Technology

Publication Date

Summer 2015

Pagination

xii, 111 pages

Note about bibliography

Includes bibliographical references (pages 108-110).

Rights

© 2015 Hui He, All rights reserved.

Document Type

Thesis - Open Access

File Type

text

Language

English

Subject Headings

Electromagnetic compatibility
Electromagnetic interference
Near-fields -- Measurement

Thesis Number

T 10740

Electronic OCLC #

921186087

Recommended Citation

He, Hui, "The development of near field probing systems for EMC near field visualization and EMI source localization" (2015). Masters Theses. 7435.
https://scholarsmine.mst.edu/masters_theses/7435