Prediction of soft error response of integrated circuits to electrostatic discharge injection via simulation field; Package interaction for electrostatic discharge soft error prediction; Full wave model for simulating noise ken electrostatic discharge generator
Prediction of soft error response of integrated circuits to electrostatic discharge injection via simulation
Field package interaction for electrostatic discharge soft error prediction
Full wave model for simulating Noise Ken electrostatic discharge generator
"In the first section, a concept for analyzing soft error response in ICs to ESD via coupling through flex cable structures is presented. Its novelty lies in accounting for the transient electromagnetic fields radiated by the ESD generator that couples to the flex cable PCB thereby causing disturbance on the IC under test. This is accomplished in three stages; first by developing a full wave model of the DUT which includes modeling the PCB and flex cable geometry and validating it in frequency domain with regard to the transfer impedance. This followed by combining the ESD generator with the DUT model to simulate the voltage at the IC input in time domain. Finally the time domain results from full wave simulation are combined with an equivalent IC response model in SPICE to predict soft error failures due ESD. In the second section, a more detailed modeling of the IC including the lead frame geometry, bond wires and IBIS/ICEM models are incorporated to investigate coupling of fields from three different injection techniques - H field loop probes, TEM cell and ESD generator. For the first time a complete simulation model which includes the ESD generator, passive elements of the DUT structure (PCB) and a detailed model of the IC has been developed to predict interaction of radiated field from the generator to the IC. The third section shows a CST MWS model was generated to simulate the discharge current and the transient field of an ESD generator. Individual components of the Noise Ken ESD generator (ESS-2000) were modeled, validated and combined. The complete full wave model was verified by comparing the simulated discharge current waveforms and induced loop voltages with the measured results"--Abstract, page iii.
Beetner, Daryl G.
Drewniak, James L.
Electrical and Computer Engineering
M.S. in Electrical Engineering
Missouri University of Science and Technology
xii, 143 pages
© 2010 Argha Nandy, All rights reserved.
Thesis - Open Access
Library of Congress Subject Headings
Integrated circuits -- Evaluation
Print OCLC #
Electronic OCLC #
Link to Catalog Recordhttp://laurel.lso.missouri.edu/record=b8075814~S5
Nandy, Argha, "Prediction of soft error response of integrated circuits to electrostatic discharge injection via simulation field; Package interaction for electrostatic discharge soft error prediction; Full wave model for simulating noise ken electrostatic discharge generator" (2010). Masters Theses. 4992.