Stressed eye analysis and jitter separation for high speed serial links
Keywords and Phrases
Inter-symbol Interference (ISI)
"As the computer and electronics industry moves towards higher data rates, the most important concern in the field of signal integrity is jitter. A data communication link path often consists of a transmitter, a channel, and a receiver. Many mechanisms can contribute to jitter, a timing uncertainty in the received signal. For example, transmitters have intrinsic noise sources that contribute to random jitter and to certain types of deterministic jitter. In addition, external coupling may cause periodic jitter. The bandwidth limitation of the channel also contributes to a fourth type of jitter, inter-symbol interference. This thesis studies the various components of jitter and uses mathematical models of them to simulate an actual transmitter. These models allow the injection of various jitter components for stressed-eye testing. To understand the sources of jitter in a received signal, this work studies the manifestation of each jitter component in the time-interval error spectrum is studied and develops procedures to separate the jitter components. These jitter decomposition procedures are compared and validated with real-time and sampling scopes. Bathtub curves and jitter transfer functions were also calculated to facilitate high-speed link path designs. Based on the link-path and jitter analysis algorithms developed here, a cable certification tool was also designed to certify the small form factor pluggable copper cable assemblies against SFF-8431 specifications. This project implemented the framework of the certification tool"--Abstract, page iii.
Fan, Jun, 1971-
Drewniak, James L.
Electrical and Computer Engineering
M.S. in Computer Engineering
Cisco Systems, Inc.
IBM Personal Systems Group
Missouri University of Science and Technology
ix, 63 pages
© 2009 Nitin Radhakrishnan, All rights reserved.
Thesis - Open Access
Library of Congress Subject Headings
High performance computing
Signal integrity (Electronics)
Print OCLC #
Electronic OCLC #
Link to Catalog Recordhttp://laurel.lso.missouri.edu/record=b7463671~S5
Radhakrishnan, Nitin, "Stressed-eye analysis and jitter separation for high-speed serial links" (2009). Masters Theses. 4715.