Validation of Circuit Extraction Procedure by Means of Frequency and Time Domain Measurement

G. Antonini
Antonio Orlandi
Vittorio Ricchiuti
Giuseppe Selli
S. Luan
James L. Drewniak, Missouri University of Science and Technology
A. C. Scogna

This document has been relocated to http://scholarsmine.mst.edu/ele_comeng_facwork/1934

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Abstract