Simulation and Measurement for Decoupling on Multilayer PCB DC Power Buses

Hao Shi
F. Yuan
James L. Drewniak, Missouri University of Science and Technology
Todd H. Hubing, Missouri University of Science and Technology
Thomas Van Doren, Missouri University of Science and Technology
Fei Sha

This document has been relocated to http://scholarsmine.mst.edu/ele_comeng_facwork/1877

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Abstract

DC power bus decoupling of a multi-layer PCB is modeled by a combination of a lumped circuit model at low frequencies (less than 200 MHz), and a mixed-potential integral equation approach at high frequencies. In order to determine the lumped parameters of via interconnects, an effective procedure using a network analyzer has been developed to characterize the trace/via inductances/resistances. For an 8"x10" ten-layer test board used in this study, the simulations show good agreement with the measurement. This method can lead to new design strategies of decoupling for multilayer PCB power buses