Abstract

Transient analysis for uniform RC structures is considered in this paper. A method is presented for determining the parameters of such structures. The measurements are obtained using impulse excitations in open-circuit and short-circuit configurations. The theoretical results obtained predict fairly the experimental results. © 1969 The American Institute of Physics.

Department(s)

Electrical and Computer Engineering

International Standard Serial Number (ISSN)

0021-8979

Document Type

Article - Journal

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2023 American Institute of Physics, All rights reserved.

Publication Date

01 Dec 1969

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