Title

Revised L-2L Method for On-Chip De-Embedding

Abstract

An evaluation is presented on the L–2L de-embedding method for on-chip transmission lines. The method is analyzed using measurement data from two chips. Results are presented in terms of scattering parameters, as is the standard for characterizing system interconnects. The various challenges associated with on-chip modeling and measurements are discussed. Furthermore, a revised version of the L–2L method is presented, decreasing its sensitivity to measurement noise. All de-embedding results are compared back to "ideal" simulation models for validation or disproof.

Department(s)

Electrical and Computer Engineering

Sponsor(s)

Cisco Research Grant
National Science Foundation (U.S.)
IEEE Power Electronics Society

Comments

This work was supported in part by the Cisco Research Grant 575262 and in part by theNational Science Foundation under Grant 0855878.
Article in Press

Keywords and Phrases

Calibration; De-embedding; Integrated circuit modeling; Integrated circuits (ICs); Interconnects; Lumped element; Mathematical model; Semiconductor device measurement; System-on-chip; Transmission line measurements; Transmission lines

International Standard Serial Number (ISSN)

0018-9375; 1558-187X

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2018 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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