Title

Need for Undergraduate and Graduate-Level Education in Testing of Microelectronic Circuits and Systems

Abstract

As deep-sub-micron and beyond technology emerges, quality assurance of microelectronic circuits and systems becomes more important than ever. Consequentially, (1) a strong need for well-educated microelectronic circuits and systems test engineers is desired by the industry, (2) graduate-level research efforts are also called to overcome numerous microelectronic circuits and systems test issues. This paper is to address issues related to increasing impact of the electronic circuits and systems test field on education in electrical and computer engineering and to propose suitable educational topics for undergraduate and graduate-level electrical and computer engineering courses.

Meeting Name

IEEE International Conference on Microelectronic Systems Education (2003: Jun. 1-2, Anaheim, CA)

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Microelectronics; Quality Assurance; Circuits and Systems; Deep Sub-Micron; Electrical and Computer Engineering; Graduate Levels; Microelectronic Circuits; Research Efforts; Test Engineers; Test Fields; Education

International Standard Book Number (ISBN)

0769519733; 9780769519739

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2003 IEEE Computer Society, All rights reserved.

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