Title

Using a Single-Ended TRL Calibration Pattern to De-Embed Coupled Transmission Lines

Abstract

Transmission line port de-embedding is critical in characterization and modeling for high-speed digital systems. De-embedding technique for single-ended transmission lines has been developed and widely used. However, few de-embedding techniques for coupled transmission lines have been reported in the literature. In this paper, a de-embedding technique for coupled transmission lines using a single-ended TRL (Thru-Reflect-Line) calibration pattern is proposed. It is based on directly obtaining VNA (Vector Network Analyzer) error correction data from measurement and post data processing. As accurate de-embedding is related to the equipments used in the measurement, the proposed technique is verified on two different VNAs with different architectures including a three-sampler VNA and a four-sampler VNA. Good agreement of de-embedded mixed-mode S-parameters has been achieved on both VNAs.

Meeting Name

IEEE International Symposium on Electromagnetic Compatibility (2009: Aug. 17-21, Austin, TX)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Calibration Patterns; Coupled Transmission Line; De-Embedding; De-Embedding Techniques; High-Speed Digital Systems; Mixed-Mode S-Parameters; Single-Ended; Thru Reflect Lines; Transmission Line; TRL Calibration; Vector Network Analyzers; Bandpass Filters; Calibration; Data Processing; Electric Lines; Electric Network Analysis; Electromagnetic Compatibility; Error Correction; Plastic Molds; Scattering Parameters; Transmission Line Theory, Electric Network Analyzers

International Standard Book Number (ISBN)

9781424442669; 9781424442676

International Standard Serial Number (ISSN)

2158-110X; 2158-1118

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2009 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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