20V-High Speed Low Cost Arbitrary Waveform Generator for ICs Immunity Test
A > 30V high speed, low resolution and low cost arbitrary waveform generator has been prototyped. It uses FPGA transceivers and resistive weighting networks and broadband power amplification. The sampling rate of this arbitrary waveform generator is 6.25 Gsps, allowing rise times down to 130 ps. As 4 transceiver channels are used a 4 bit resolution is achieved. The generator is combined with a wide band (20MHz - 6 GHz) power amplifier allowing > 20V at 50-Ohm load. The intended application is IC immunity testing. Here different waveforms and exact timing is needed. Using different FPGAs the concept can be extended to higher resolution and faster sampling rates. The project was completed in a 400 level RF design class during only one semester.
X. Gao et al., "20V-High Speed Low Cost Arbitrary Waveform Generator for ICs Immunity Test," Proceedings of the 2011 IEEE International Symposium on Electromagnetic Compatibility (2011, Long Beach, CA), pp. 846-849, Institute of Electrical and Electronics Engineers (IEEE), Aug 2011.
The definitive version is available at http://dx.doi.org/10.1109/ISEMC.2011.6038426
2011 IEEE International Symposium on Electromagnetic Compatibility (2011: Aug. 14-19, Long Beach, CA)
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Arbitrary Waveform Generator; Bit Resolution; Higher Resolution; Immunity Test; Immunity Testing; Low Costs; Low Resolution; Power Amplification; RF Design; Sampling Rates; Wave Forms; Wide-band; Broadband Amplifiers; Electromagnetic Compatibility; Electromagnetism; Power Amplifiers; Transceivers; Waveform Analysis
International Standard Book Number (ISBN)
International Standard Serial Number (ISSN)
Article - Conference proceedings
© 2011 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.