Fast Method for EIS Sweep Test
This paper proposed a novel fast band-sweep measurement method for efficient isotropic sensitivity (EIS) of wireless devices. The method is built on the facts that the relationship between the bit error rate (BER) and the received power is generally consistent in the same band, and the EIS values at a fixed angle is slowly-changing on the frequency except harmonics. Therefore, only few frequency points are required to be measured for a whole band sweep test resulting in a significantly decrease in measurement time.
P. Shen et al., "Fast Method for EIS Sweep Test," Proceedings of the 7th Asia-Pacific International Symposium on Electromagnetic Compatibility (2016, Shenzhen, China), pp. 800-803, Institute of Electrical and Electronics Engineers (IEEE), May 2016.
The definitive version is available at http://dx.doi.org/10.1109/APEMC.2016.7522871
7th Asia-Pacific International Symposium on Electromagnetic Compatibility (2016: May 17-21, Shenzhen, China)
Electrical and Computer Engineering
Center for High Performance Computing Research
Second Research Center/Lab
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Electromagnetic compatibility; efficient isotropic sensitivity; Fast methods; harmonics; Measurement time; Received power; Sweep measurements; Sweep tests; Wireless devices; Bit error rate; band-sweep test
International Standard Book Number (ISBN)
Article - Conference proceedings
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