Abstract

Aim of this paper is the validation in both frequency and time domain of the procedure to extract fully H-Spice compatible equivalent circuits of structures on printed circuit boards. The procedure is initiated by standard measurement of scattering parameters between 40MHz to 20GH. After the extraction of the equivalent circuit, the computed scattering parameters are compared with those measured. The same equivalent circuit is also used for transient analysis in order to compare TDR measurement and eye-pattern to a pseudo-random bit sequence with those coming from the simulations.

Meeting Name

IEEE International Symposium on Electromagnetic Compatibility (2005: Aug. 8-12, Chicago, IL)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Computer Simulation; Frequency Domain Analysis; Printed Circuit Boards; Scattering Parameters; Time Domain Analysis; Equivalent Circuit Extraction; Eye-Pattern; Pseudo-Random Bit Sequence; SPICE; TDR; Transient Analysis; Networks (Circuits)

International Standard Book Number (ISBN)

0780393805; 9780780393806

International Standard Serial Number (ISSN)

2158-110X; 2158-1118

Document Type

Article - Conference proceedings

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2005 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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