Abstract
Aim of this paper is the validation in both frequency and time domain of the procedure to extract fully H-Spice compatible equivalent circuits of structures on printed circuit boards. The procedure is initiated by standard measurement of scattering parameters between 40MHz to 20GH. After the extraction of the equivalent circuit, the computed scattering parameters are compared with those measured. The same equivalent circuit is also used for transient analysis in order to compare TDR measurement and eye-pattern to a pseudo-random bit sequence with those coming from the simulations.
Recommended Citation
G. Antonini et al., "Validation of Circuit Extraction Procedure by Means of Frequency and Time Domain Measurement," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2005, Chicago, IL), vol. 1, pp. 45 - 50, Institute of Electrical and Electronics Engineers (IEEE), Aug 2005.
The definitive version is available at https://doi.org/10.1109/ISEMC.2005.1513469
Meeting Name
IEEE International Symposium on Electromagnetic Compatibility (2005: Aug. 8-12, Chicago, IL)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Computer Simulation; Frequency Domain Analysis; Printed Circuit Boards; Scattering Parameters; Time Domain Analysis; Equivalent Circuit Extraction; Eye-Pattern; Pseudo-Random Bit Sequence; SPICE; TDR; Transient Analysis; Networks (Circuits)
International Standard Book Number (ISBN)
978-0780393806
International Standard Serial Number (ISSN)
2158-110X; 2158-1118
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2005 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2005
