Abstract

Large and complex ASICs are source of propagating noise inside the powerbus planes. A lumped noise source model is proposed and validated by means of a statistics based method.

Meeting Name

Electrical Performance of Electronic Packaging (2003: Oct. 27-29, Princeton, NJ)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

EMI Modeling; Application Specific Integrated Circuits; Cavity-Resonator Model; Electromagnetic Interference; Fast Transient Current; Frequency Response; Integrated Circuit Modelling; Integrated Circuit Noise; Large Complex ASIC; Lumped Noise Source Model; Power Supplying Pins; Powerbus Planes; Propagating Noise; Single Noise-Current Source; Statistics Based Method

International Standard Book Number (ISBN)

0780381289; 9780780381285

Document Type

Article - Conference proceedings

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2003 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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