Abstract

In this paper, the susceptibility of an 8-bit microcontroller to electrostatic discharge (ESD) and electrically fast transients was tested by injecting currents through a capacitive probe into the microcontroller package pins. The reaction of the microcontroller to discharges with different rise times and polarities were investigated by measuring the voltage on the tested pins and by observing the microcontroller's clock output. Susceptibility varied significantly when injecting to one pin compared to another. Interestingly, the clock was more sensitive to currents injected into I/O pins than into pins directly related to the clock (e. g. EXTAL). Further work is underway to explain the causes of susceptibility inside the IC.

Meeting Name

2007 IEEE International Symposium on Electromagnetic Compatibility, EMC 2007 (2007: Jul. 9-13, Honolulu, HI)

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Electrostatic Discharge; Sensitivity; Microcontroller; Immunity; Testing

Library of Congress Subject Headings

Electric discharges
Microcontrollers

International Standard Book Number (ISBN)

1-4244-1349-4

International Standard Serial Number (ISSN)

2158-110X

Document Type

Article - Conference proceedings

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2007 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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