Abstract

An accurate analytical model to predict via coupling within rectangular power-return plane structures is developed. Loss mechanisms, including radiation loss, dielectric loss, and conductor loss, are considered in this model. The radiation loss is incorporated into a complex propagating wavenumber as an artificial loss mechanism. The quality factors associated with three loss mechanisms are calculated and compared. The effects of radiation loss on input impedances and reflection coefficients are investigated for both high-dielectric-loss and low-dielectric-loss printed circuit boards. Measurements are performed to validate the effectiveness of this model.

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Complex Propagating Wavenumber; Conductor Loss; Dielectric Loss; Dielectric Losses; Electric Impedance; Electromagnetic Compatibility; Electromagnetic Interference; Electromagnetic Wave Propagation; High-Dielectric-Loss Printed Circuit Board; Low-Dielectric-Loss Printed Circuit Board; Network Analysis; Printed Circuits; Radiation Loss; Rectangular Power-Ground Structure; Rectangular Power-Return Plane Structure

International Standard Serial Number (ISSN)

0018-9375

Document Type

Article - Journal

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2005 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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