Abstract
The definition of common-mode loop impedance is proposed instead of the ambiguous definition of common-mode impedance. Moreover, a non-invasive measurement method to characterize the common-mode loop impedance using dual clamp-on current probe is presented herein. The frequency responses of the current probes are de-embedded through a calibration procedure. Independent direct measurements using a network analyzer corroborate the validity of the Dual-Current-Probe Method.
Recommended Citation
G. Liu et al., "A Dual-current Method for Characterizing Common-Mode Loop Impedance," Proceedings of the 20th IEEE Instrumentation and Measurement Technology Conference (2003, Vail, CO), vol. 2, pp. 1239 - 1244, Institute of Electrical and Electronics Engineers (IEEE), May 2003.
The definitive version is available at https://doi.org/10.1109/IMTC.2003.1207950
Meeting Name
20th IEEE Instrumentation and Measurement Technology Conference (2003: May 20-22, Vail, CO)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Calibration Procedure; Common-Mode Loop Impedance; Dual Clamp-On Current Probe; Dual Current Probe Method; Dual-Current Method; Electric Impedance Measurement; Frequency Response; Independent Direct Measurement; Network Analyzer; Noninvasive Measurement Method; Probes; Spectral Analysers; Transmission Lines; Current Measurement; Transmission Line Measurements; Wire; Impedance Measurement; Power Transmission Lines; Power Cables; Transmission Line Theory; Electromagnetic Compatibility; Calibration
International Standard Book Number (ISBN)
780377052
International Standard Serial Number (ISSN)
1091-5281
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2003 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 May 2003
