Abstract

It is crucial for cancer diagnosis and treatment to accurately identify the site of origin of a tumor. with the emergence and rapid advancement of DNA microarray technologies, constructing gene expression profiles for different cancer types has already become a promising means for cancer classification. In addition to research on binary classification such as normal versus tumor samples, which attracts numerous efforts from a variety of disciplines, the discrimination of multiple tumor types is also important. Meanwhile, the selection of genes which are relevant to a certain cancer type not only improves the performance of the classifiers, but also provides molecular insights for treatment and drug development. Here, we use Semisupervised Ellipsoid ARTMAP (ssEAM) for multiclass cancer discrimination and particle swarm optimization for informative gene selection. ssEAM is a neural network architecture rooted in Adaptive Resonance Theory and suitable for classification tasks. ssEAM features fast, stable, and finite learning and creates hyperellipsoidal clusters, inducing complex nonlinear decision boundaries. PSO is an evolutionary algorithm-based technique for global optimization. A discrete binary version of PSO is employed to indicate whether genes are chosen or not. The effectiveness of ssEAM/PSO for multiclass cancer diagnosis is demonstrated by testing it on three publicly available multiple-class cancer data sets. ssEAM/PSO achieves competitive performance on all these data sets, with results comparable to or better than those obtained by other classifiers.

Department(s)

Electrical and Computer Engineering

Second Department

Computer Science

Sponsor(s)

Mary K. Finley Missouri Endowment
National Science Foundation (U.S.)

Keywords and Phrases

Cancer Classification; Gene Explosion Profiles; Particle Swarm Optimization; Semisupervised Ellipsoid ARTMAP

Document Type

Article - Journal

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2007 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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