Doctoral Dissertations

Instrument response function for scanning force microscopy and defects on mica induced by 50 kilo-electron-volts argon ions

Author

Lu Fei

Department(s)

Physics

Degree Name

Ph. D. in Physics

Publisher

University of Missouri--Rolla

Publication Date

Summer 1996

Pagination

xvi, 121 pages

Note about bibliography

Includes bibliographical references (pages 117-120).

Rights

© 1996 Lu Fei, All rights reserved.

Document Type

Dissertation - Citation

File Type

text

Language

English

Thesis Number

T 7198

Print OCLC #

36905599

Link to Catalog Record

Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.

http://merlin.lib.umsystem.edu/record=b3589397~S5

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