Doctoral Dissertations
Instrument response function for scanning force microscopy and defects on mica induced by 50 kilo-electron-volts argon ions
Department(s)
Physics
Degree Name
Ph. D. in Physics
Publisher
University of Missouri--Rolla
Publication Date
Summer 1996
Pagination
xvi, 121 pages
Note about bibliography
Includes bibliographical references (pages 117-120).
Rights
© 1996 Lu Fei, All rights reserved.
Document Type
Dissertation - Citation
File Type
text
Language
English
Thesis Number
T 7198
Print OCLC #
36905599
Link to Catalog Record
Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.
http://merlin.lib.umsystem.edu/record=b3589397~S5Recommended Citation
Fei, Lu, "Instrument response function for scanning force microscopy and defects on mica induced by 50 kilo-electron-volts argon ions" (1996). Doctoral Dissertations. 1172.
https://scholarsmine.mst.edu/doctoral_dissertations/1172
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