Instrument response function for scanning force microscopy and defects on mica induced by 50 kilo-electron-volts argon ions
Ph. D. in Physics
University of Missouri--Rolla
xvi, 121 leaves
© 1996 Lu Fei, All rights reserved.
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Fei, Lu, "Instrument response function for scanning force microscopy and defects on mica induced by 50 kilo-electron-volts argon ions" (1996). Doctoral Dissertations. 1172.
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