Measurement and Analysis of GaAs Solar Cells
Department
Electrical and Computer Engineering
Major
Computer Engineering
Research Advisor
Ferguson, Ian T.
Advisor's Department
Electrical and Computer Engineering
Abstract
III-V compound semiconductor have been receiving increasing research interest due to their unique optical, electrical, and magnetic properties. In this report, we investigate the photovoltaic properties of GaAs metal-semiconductor (M-S) Schottky junction solar cells, such as open-circuit voltage (Voc), short-circuit current (Isc), and fill factor (FF). A home-made solar simulator setup is used in order to test the solar cells with different top electrode structures under industry lighting standards of AM1.5g 1000 W/cm2. The characteristics of Schottky junction diodes, such as Schottky barrier height, ideality factor, series resistance, are also extracted using the I-V curves plotted with OriginLab data analysis software.
Biography
Andrew Woode is a senior year Computer Engineering student, with an emphasis on computer networks. He is also an undergraduate research assistant in Dr. Ian Ferguson’s POETS research lab, working with other graduate students in order to measure and characterize III-V based solar cells.
Research Category
Engineering
Presentation Type
Poster Presentation
Document Type
Poster
Location
Upper Atrium
Presentation Date
16 Apr 2019, 9:00 am - 3:00 pm
Measurement and Analysis of GaAs Solar Cells
Upper Atrium
III-V compound semiconductor have been receiving increasing research interest due to their unique optical, electrical, and magnetic properties. In this report, we investigate the photovoltaic properties of GaAs metal-semiconductor (M-S) Schottky junction solar cells, such as open-circuit voltage (Voc), short-circuit current (Isc), and fill factor (FF). A home-made solar simulator setup is used in order to test the solar cells with different top electrode structures under industry lighting standards of AM1.5g 1000 W/cm2. The characteristics of Schottky junction diodes, such as Schottky barrier height, ideality factor, series resistance, are also extracted using the I-V curves plotted with OriginLab data analysis software.
