Department
Electrical and Computer Engineering
Major
Electrical & Computer Engineering
Research Advisor
Al-Assadi, Waleed K.
Advisor's Department
Electrical and Computer Engineering
Funding Source
Vice Provost for Undergraduate Studies
Abstract
The on-chip transient current monitor is used to detect transient currents in a circuit under test. Built-in current testing improves the defect coverage in chips. Transient power supply current testing is used to supplement the existing test methods to improve defect coverage. The proposed transient current monitor is used to measure transient currents for a wide range of amplitudes ranging from a very few micro amperes to a magnitude of milli Amperes and of pulse widths as small as few pico seconds. This monitor is built and tested using AMI 0.5μ and TSMC 0.18μ technologies.
Biography
Joel K. Harms is a senior studying Electrical Engineering and Computer Engineering from Missouri University of Science & Technology. Harms will graduate with a Bachelor of Science in both degrees in December of 2008. Harms has performed research in Wireless Sensor Networks Watershed Soil Monitoring and Built-ln Transient Current Monitors.
Research Category
Engineering
Presentation Type
Oral Presentation
Document Type
Presentation
Award
Engineering oral presentation, Third place
Location
Havener Center, Ozark Room
Presentation Date
09 Apr 2008, 10:00 am - 10:30 am
Built-in Transient Current Monitor for Integrated Circuits Testing
Havener Center, Ozark Room
The on-chip transient current monitor is used to detect transient currents in a circuit under test. Built-in current testing improves the defect coverage in chips. Transient power supply current testing is used to supplement the existing test methods to improve defect coverage. The proposed transient current monitor is used to measure transient currents for a wide range of amplitudes ranging from a very few micro amperes to a magnitude of milli Amperes and of pulse widths as small as few pico seconds. This monitor is built and tested using AMI 0.5μ and TSMC 0.18μ technologies.
