Abstract

Experimental Observations Have Been Made for the First Time that Surface Electromagnetic Wave (SEW) Spectroscopy Can Be Used to Measure the Infrared Spectra of Adsorbed Molecules and Very Thin Films on Metal Surfaces. using a Tunable CO2 Laser (9.2-10.8 Μm Wavelength), the 975 and the 1037 Cm-1 Resonances of 5-25 Å Thick Physiosorbed Benzene on Copper Were Observed. Broadening of These Resonances for the Thinnest Layers of Benzene Was Observed. Also SEW Spectroscopy and Ellipsometry Were Used to Study Thin Films of Cellulose Acetate (15-75 Å) on Copper. Further, It Was Shown that Film Thicknesses Determined by SEW Spectroscopy Are in Agreement with the Ellipso metric Thicknesses and that the SEW Method is More Sensitive for Very Thin (<25 >Å) Films. Copyright © 1976 American Institute of Physics.

Department(s)

Physics

International Standard Serial Number (ISSN)

0021-9606

Document Type

Article - Journal

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2023 American Institute of Physics, All rights reserved.

Publication Date

01 Jan 1976

Included in

Physics Commons

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