Electrical Behavior of a Simple Helical Flux Compression Generator for Code Benchmarking
A variety of basic magnetic flux compression (MFC) generator geometries have been tested during the last three decades. Though size and operating regimes differ widely, it is apparent that the helical flux compression generator is the most promising concept with respect to current amplification and compactness. Though the geometry of the helical generator (dynamically expanding armature in the center of a current carrying helix) seems to be basic, it turns out that the understanding of all involved processes is rather difficult. This fact is apparent from the present lack of a computer model that is solely based on physical principles and manages without heuristic factors. A simple generator was designed to address flux and current losses of the helical generator. The generator's maximum current amplitude is given as a function of the seed current and the resulting "seed-current" spread is compared to the output of state-of-the-art computer models. Temporally resolved current and current time derivative signals are compared as well. The detailed generator geometry is introduced in order to facilitate future computer code bench marking or development. The impact of this research on the present understanding of magnetic flux losses in helical MFC generators is briefly discussed.
A. Neuber and J. Dickens and J. B. Cornette and K. Jamison and E. R. Parkinson and M. Giesselmann and P. N. Worsey and J. Baird and M. Schmidt and M. Kristiansen, "Electrical Behavior of a Simple Helical Flux Compression Generator for Code Benchmarking," IEEE Transactions on Plasma Science, Institute of Electrical and Electronics Engineers (IEEE), Jan 2001.
The definitive version is available at https://doi.org/10.1109/27.940950
IEEE Nuclear and Plasma Sciences Society
Keywords and Phrases
Magnetic Flux; Performance Evaluation; Pulse Generators; Pulsed Power Supplies
International Standard Serial Number (ISSN)
Article - Journal
© 2001 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Jan 2001