Radiation Resistance Testing of MOSFET and CMOS as a Means of Risk Management

Akira Tokuhiro, Missouri University of Science and Technology
Massimo F. Bertino, Missouri University of Science and Technology

This record had 245 downloads on 29 Oct 2020 before it was moved to the new Nuclear Engineering Department: https://scholarsmine.mst.edu/nuclear_facwork/465


Whether for military, research (space, accelerator physics) and/or civilian use, risk avoidance against radiation-induced damage is not possible with COTS parts. Thus the sensible approach is risk management. We recommend a sensible risk management approach as follows: 1) know the radiation environment of the intended application to the extent possible; 2) know the effects of ionizing radiation on the component(s) of interest; 3) know the requirements of the application; 4) identify the candidate or chosen components; 5) test the components; 6) design-in safety factor margins to the extent possible.