Recommended Citation
M. Loganathan and D. A. Bristow, "Bi-Harmonic Cantilever Design for Improved Measurement Sensitivity in Tapping-Mode Atomic Force Microscopy," Review of Scientific Instruments, vol. 85, no. 4, American Institute of Physics (AIP), Apr 2014.
The definitive version is available at https://doi.org/10.1063/1.4870409
Department(s)
Mechanical and Aerospace Engineering
International Standard Serial Number (ISSN)
0034-6748
Document Type
Article - Journal
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2014 American Institute of Physics (AIP), All rights reserved.
Publication Date
01 Apr 2014
Comments
This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing.