Preparation and Characterization Methods of Thin-Layer Samples for Standoff Detection
Abstract
Detection of analytes deposited on surfaces is crucial for many applications: Development of methods to prepare thin layers (e.g. ~5 to 100 μm) is important for both system design and field studies. in this work, solid and liquid analytes were deposited on painted and bare substrates including aluminum, glass, plastic, and concrete using an ExactaCoat ultrasonic spray coater. Laboratory hemispherical reflectance (HRF) spectra were collected for samples with different layer thicknesses so as to characterize both the composition and layer thickness. Preliminary results demonstrate that to prepare homogenous layers on surfaces, parameters such as substrate type, analyte solubility, vapor pressure, paint color, surface porosity, and surface roughness are all important. Liquid chemicals posed several issues during deposition: Diisopropyl methyl phosphonate evaporated from surfaces more quickly than the other chemicals and was thus not detected in the HRF experiments. Less volatile liquids, such as tributylphosphate, remained on the surface for the duration of the test, but a uniform layer thickness could not be obtained as the liquid pooled to one side when mounted at an angle. the deposition of solids (e.g., acetaminophen, caffeine and methylphosphonic acid) from volatile solvents such as chloroform also proved problematic due to streaking caused by rapid solvent evaporation. Solids deposited from ethanol, however, worked well on bare substrates. for most samples plotting the integrated infrared band strength vs.. surface thicknesses showed a linear relationship, confirming that the surface loading can be controlled by programming the concentration and the number of passes on the ultrasonic sprayer.
Recommended Citation
O. M. Primera-Pedrozo et al., "Preparation and Characterization Methods of Thin-Layer Samples for Standoff Detection," Proceedings of SPIE - The International Society for Optical Engineering, vol. 12541, article no. 125410Q, Society for Photo-Optical Instrumentation Engineers, Jan 2023.
The definitive version is available at https://doi.org/10.1117/12.2663444
Department(s)
Materials Science and Engineering
Keywords and Phrases
deposition; hemispherical reflectance; infrared standoff; Thin layer; ultrasonic layers
International Standard Book Number (ISBN)
978-151066198-1
International Standard Serial Number (ISSN)
1996-756X; 0277-786X
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2025 Society for Photo-Optical Instrumentation Engineers, All rights reserved.
Publication Date
01 Jan 2023
Comments
U.S. Department of Energy, Grant DEAC05-76RLO1830