"The purpose of this investigation was to study the effect of instrument parameter changes upon X-ray intensity measurements of the copper-manganese system. The parameters utilized in this study included: (1) polished, contaminated, and 600 grit surfaces ; (2) constant sample current and constant beam current modes; and (3) 15 KV, 20 KV, and 25 KV accelerating potentials. Inspection of the data disclosed three interesting points: (1) copper and manganese X-ray intensity measurements appear to be a linear function of composition in the 15 KV through 25 KV accelerating potential range; (2) electron backscatter measurements consistently show in a limited range coefficients larger than either of the pure elements; (3) X- ray diffraction studies of these alloys indicates that the lattice parameters are increasing; whereas, if manganese were added substitutionally the parameters would change very little. Subsequent analysis of the data produced two empirical methods of utilizing uncorrected data without applying advanced mathematical corrections. The two empirical methods are : (1) a linear adjustment method; and (2) a graphical compensating method"--Abstract, Page ii.
Clark, J. B. (J. Beverley)
Hill, Otto H.
Materials Science and Engineering
M.S. in Metallurgical Engineering
George C. Marshall Space Flight Center
University of Missouri--Rolla
vi, 88 Pages
© 1970 Richard Arlen Parr, All rights reserved.
Thesis - Open Access
Library of Congress Subject Headings
X-rays -- Measurement
Print OCLC #
Electronic OCLC #
Link to Catalog Record
Parr, R. A., "A systematic study of instrument variables upon the accuracy of microprobe analysis" (1970). Masters Theses. 7062.