An investigation of the low voltage failure mechanism in multilayer ceramic capacitors

Author

Christopher John Brannon

Abstract

"Enhanced leakage current was induced into multilayer ceramic capacitors by the introduction of micro-cracks. These cracks extended from the surface through the electrode layers and were formed by means of thermal shock. The capacitors were then exposed to a low voltage bias and a humid atmosphere. Results indicated that a simple electrolytic solution mechanism may be responsible for the increased conduction, and that the proposed dendritic growth mechanisms may be more complex than necessary"--Abstract, p. ii

Advisor(s)

Harlan U. Anderson

Committee Member(s)

Illegible Signature
Don M. Sparlin

Department(s)

Materials Science and Engineering

Degree Name

M.S. in Ceramic Engineering

Publisher

University of Missouri--Rolla

Publication Date

Fall 1986

Pagination

vii, 52 pages

Note about bibliography

Includes bibliographic references (pages 49-51).

Rights

© 1986 C. John Brannon, All rights reserved.

Document Type

Thesis - Open Access

File Type

text

Language

English

Thesis Number

T 5406

Print OCLC #

15507125

Recommended Citation

Brannon, Christopher John, "An investigation of the low voltage failure mechanism in multilayer ceramic capacitors" (1986). Masters Theses. 438.
https://scholarsmine.mst.edu/masters_theses/438