Masters Theses
A computer controlled data acquisition system for testing semiconductor devices.
Department(s)
Electrical and Computer Engineering
Degree Name
M.S. in Electrical Engineering
Publisher
University of Missouri--Rolla
Publication Date
1977
Pagination
144 pages
Rights
© 1977 Terrence Daniel Pickett, All rights reserved.
Document Type
Thesis - Citation
File Type
text
Language
English
Thesis Number
T 4319
Print OCLC #
6000221
Link to Catalog Record
Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.
http://merlin.lib.umsystem.edu/record=b1067575~S5Recommended Citation
Pickett, Terrence Daniel, "A computer controlled data acquisition system for testing semiconductor devices." (1977). Masters Theses. 4245.
https://scholarsmine.mst.edu/masters_theses/4245
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