"Microstructural changes in unsupported nanocrystalline yttrium stabilized zirconia (ZrO2 : 16%Y, or YSZ) thin films were examined as a function of temperature and annealing time in order to determine the grain growth exponent and the mechanisms of pinhole formation. Grain growth and pinhole formation were measured using high resolution transmission electron microscopy (HRTEM), normal imaging mode transmission electron microscopy (TEM), electron diffraction, and energy dispersive X- ray microanalysis (EDS). Grain growth was found to vary with a time exponent of one half at lower temperatures. Pinhole formation in 70 nm thick films occurred at temperatures near 600°C, corresponding to a grain size of about 15nm, or a grain size to film thickness ratio of approximately 0.25. Results from these studies suggest that the formation of these pinholes decreases the grain growth rate to a time exponent of one third"--Abstract, page iii.
Anderson, H. U. (Harlan U.)
Miller, F. Scott, 1956-
Materials Science and Engineering
M.S. in Ceramic Engineering
University of Missouri--Rolla
xi, 121 pages
© 2000 Brian Patrick Gorman, All rights reserved.
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Gorman, Brian P., "Microstructure development in unsupported nanocrystalline thin films" (2000). Masters Theses. 1912.
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