Location
San Diego, California
Presentation Date
26 May 2010, 4:45 pm - 6:45 pm
Abstract
The pseudo method used to calculate shear wave velocity (Vs) in seismic cone penetration (SCP) tests often generates high variability of Vs values at shallow depths. This occurs when travel paths are small and signal variability large to allow accurate arrival time differentiation between successive signals. The offset distance between the source and receivers has the largest influence on signal variability. A method described in this paper shows good results in reducing Vs variability of SCP tests during post processing. The method consists of increasing the sampling interval to calculate Vs and then regrouping the data to provide its original test-depth profile. The method is illustrated with a case study.
Department(s)
Civil, Architectural and Environmental Engineering
Meeting Name
5th International Conference on Recent Advances in Geotechnical Earthquake Engineering and Soil Dynamics
Publisher
Missouri University of Science and Technology
Document Version
Final Version
Rights
© 2010 Missouri University of Science and Technology, All rights reserved.
Creative Commons Licensing
This work is licensed under a Creative Commons Attribution-Noncommercial-No Derivative Works 4.0 License.
Document Type
Article - Conference proceedings
File Type
text
Language
English
Recommended Citation
Areias, Lou, "Method to Reduce Variability of S-Wave Profiles in Seismic Cone Penetration Tests" (2010). International Conferences on Recent Advances in Geotechnical Earthquake Engineering and Soil Dynamics. 17.
https://scholarsmine.mst.edu/icrageesd/05icrageesd/session01b/17
Included in
Method to Reduce Variability of S-Wave Profiles in Seismic Cone Penetration Tests
San Diego, California
The pseudo method used to calculate shear wave velocity (Vs) in seismic cone penetration (SCP) tests often generates high variability of Vs values at shallow depths. This occurs when travel paths are small and signal variability large to allow accurate arrival time differentiation between successive signals. The offset distance between the source and receivers has the largest influence on signal variability. A method described in this paper shows good results in reducing Vs variability of SCP tests during post processing. The method consists of increasing the sampling interval to calculate Vs and then regrouping the data to provide its original test-depth profile. The method is illustrated with a case study.
