Location

San Diego, California

Session Start Date

5-24-2010

Session End Date

5-29-2010

Abstract

The pseudo method used to calculate shear wave velocity (Vs) in seismic cone penetration (SCP) tests often generates high variability of Vs values at shallow depths. This occurs when travel paths are small and signal variability large to allow accurate arrival time differentiation between successive signals. The offset distance between the source and receivers has the largest influence on signal variability. A method described in this paper shows good results in reducing Vs variability of SCP tests during post processing. The method consists of increasing the sampling interval to calculate Vs and then regrouping the data to provide its original test-depth profile. The method is illustrated with a case study.

Department(s)

Civil, Architectural and Environmental Engineering

Appears In

International Conferences on Recent Advances in Geotechnical Earthquake Engineering and Soil Dynamics

Meeting Name

Fifth Conference

Publisher

Missouri University of Science and Technology

Publication Date

5-24-2010

Document Version

Final Version

Rights

© 2010 Missouri University of Science and Technology, All rights reserved.

Document Type

Article - Conference proceedings

File Type

text

Language

English

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May 24th, 12:00 AM May 29th, 12:00 AM

Method to Reduce Variability of S-Wave Profiles in Seismic Cone Penetration Tests

San Diego, California

The pseudo method used to calculate shear wave velocity (Vs) in seismic cone penetration (SCP) tests often generates high variability of Vs values at shallow depths. This occurs when travel paths are small and signal variability large to allow accurate arrival time differentiation between successive signals. The offset distance between the source and receivers has the largest influence on signal variability. A method described in this paper shows good results in reducing Vs variability of SCP tests during post processing. The method consists of increasing the sampling interval to calculate Vs and then regrouping the data to provide its original test-depth profile. The method is illustrated with a case study.