Automated Near-Field Scanning to Identify Resonances

Giorgi Muchaidze
Huang Wei
Jin Min
Shao Peng
James L. Drewniak, Missouri University of Science and Technology
David Pommerenke, Missouri University of Science and Technology

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Near-field scanning systems are a tool for rootcause ESD, EMI, and immunity analysis of electronic systems, as well as qualification methodology for ICs and modules. For emissions, they have developed into a standardized method. Development of universally accepted file formats for data exchange is on-going. Four main types of scanning have been implemented by this and other authors: Near-field EMI scanning, ESD scanning, radiated immunity scanning, and resonance scanning. This article concentrates on resonance scanning as a newly added method for automated EMC system analysis.